首页> 外国专利> QUANTITATIVE GRASPING METHOD AND QUANTITATIVE GRASPING DEVICE FOR SYMMETRY LOSS LEVEL

QUANTITATIVE GRASPING METHOD AND QUANTITATIVE GRASPING DEVICE FOR SYMMETRY LOSS LEVEL

机译:对称丢失级别的定量抓取方法和定量抓取装置

摘要

PROBLEM TO BE SOLVED: To quantitatively grasp a level of symmetry loss caused by any disturbance occurring in a structure having symmetry.;SOLUTION: Arrangement information is obtained from a measuring object and is made into a matrix, and a matrix representing a basic structure with no disturbance occurring in the measuring object is extracted. A conversion filter that is a matrix diagonalizing the matrix representing the basic structure is obtained. The conversion filter is applied to the arrangement information on the measuring object made into a matrix to be partitioned into a block matrix.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:要定量地把握由具有对称性的结构中发生的任何干扰引起的对称性损失的水平;解决方案:从测量对象获得排列信息,并将其制成矩阵,并用一个矩阵表示基本结构不会提取在测量对象中发生的干扰。获得转换滤波器,该转换滤波器是将代表基本结构的矩阵对角化的矩阵。转换滤波器用于将测量对象的排列信息制成矩阵,然后将其划分为块矩阵。版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013142976A

    专利类型

  • 公开/公告日2013-07-22

    原文格式PDF

  • 申请/专利权人 HIROSHIMA UNIV;

    申请/专利号JP20120002363

  • 发明设计人 ARIO ICHIRO;

    申请日2012-01-10

  • 分类号G06T7/60;

  • 国家 JP

  • 入库时间 2022-08-21 17:01:49

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号