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IMAGE UNEVENNESS SAMPLE DATA CREATING METHOD, IMAGE UNEVENNESS INSPECTION METHOD AND IMAGE UNEVENNESS SAMPLE DATA CREATING SYSTEM

机译:图像不均匀度样本数据创建方法,图像不均匀度检查方法和图像不均匀度样本数据创建系统

摘要

PROBLEM TO BE SOLVED: To reduce time and work used for selecting an image unevenness limit sample panel or the like.;SOLUTION: An image unevenness sample data creating method ST100 includes a step ST101 to prepare a liquid crystal panel conforming to a predetermined acceptance standard as an acceptable panel, a step ST102 to prepare a liquid crystal panel, which is determined an image generating unevenness on the basis of a predetermined image unevenness standard, as a reference panel, a step ST103 to take an image unevenness of the reference panel using a camera, a step ST104 to process the taken image using an image processing software, and a step ST105 to display the processed image on the acceptable panel. In the steps ST104 and ST105, the taken image is processed so that the image displayed on the acceptable panel is an image which represents desired image unevenness, and adopts the image data of the processed image so as to represent the desired image unevenness as a piece of image unevenness sample data.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:为了减少用于选择图像不均匀极限样本面板等的时间和工作。解决方案:图像不均匀样本数据创建方法ST100包括步骤ST101,以制备符合预定接受标准的液晶面板。作为可接受的面板,步骤ST102制备液晶面板,作为参考面板,步骤ST102制备液晶面板,该液晶面板基于预定的图像不均匀度标准确定图像产生不均匀性,步骤ST103使用以下步骤获取参考面板的图像不均匀度:照相机,步骤ST104以使用图像处理软件处理拍摄的图像,步骤ST105以在可接受的面板上显示处理后的图像。在步骤ST104和ST105中,对拍摄图像进行处理,使得在可接受面板上显示的图像是代表期望图像不均匀性的图像,并且采用处理后图像的图像数据以代表期望图像不均匀性。图像不均匀性样本数据的分析。;版权所有:(C)2013,日本特许厅&INPIT

著录项

  • 公开/公告号JP2012233709A

    专利类型

  • 公开/公告日2012-11-29

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORP;

    申请/专利号JP20110100523

  • 发明设计人 NAKAJIMA ISAO;

    申请日2011-04-28

  • 分类号G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-21 16:59:51

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