The ion analysis method in a time-of-flight mass spectrometer and a time-of-flight mass spectrometer

摘要

Time-of-flight mass spectrometer (1), time-of-flight divided linear ion device for receiving the sample ions to be supplied to the ion source, from the ion source (10) for analyzing ions ejected from the splitting device I equipped with a mass spectrometer. The trapped in the segments adjacent groups of two or more ions first and then trapping voltage for capturing the area of ​​the splitting device shorter than the segment group ions is applied to the splitting device. Trapping voltage is also effective to provide a uniform trapping field along the entire length of the device (10).