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SURFACE ROUGHNESS MEASURING DEVICE, MEASUREMENT STAND-BY TIME SETTING METHOD, AND MEASUREMENT STAND-BY TIME SETTING PROGRAM

机译:表面粗糙度测量装置,测量待机时间设定方法以及测量待机时间设定程序

摘要

PROBLEM TO BE SOLVED: To provide a surface roughness measuring device which allows measurement even for a section having a narrow measurement range while reducing measurement start time.;SOLUTION: Measurement data on displacement is acquired by scanning a test piece 80 by a pickup 16. The measurement begins immediately after a start of the travel of the pickup 16. The displacement measurement data acquired through the measurement is analyzed and a point from which a measured-value begins to become stable is detected as a measured-value stabilization starting point. A travel time required for the pickup 16 to reach the measured value stabilization starting point is obtained. The obtained transit time is set to be a measurement stand-by time.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种表面粗糙度测量装置,该装置即使在测量范围狭窄的部分也能够进行测量,同时减少测量开始时间。在拾取器16开始行进之后立即开始测量。分析通过测量获取的位移测量数据,并且检测到测量值开始变得稳定的点作为测量值稳定化起点。获得拾取器16达到测量值稳定开始点所需的行进时间。获得的渡越时间被设置为测量待机时间。; COPYRIGHT:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013007586A

    专利类型

  • 公开/公告日2013-01-10

    原文格式PDF

  • 申请/专利权人 TOKYO SEIMITSU CO LTD;

    申请/专利号JP20110138849

  • 发明设计人 ENOMOTO MASAHITO;

    申请日2011-06-22

  • 分类号G01B5/28;

  • 国家 JP

  • 入库时间 2022-08-21 16:58:01

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