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ELEMENT MODEL, ELEMENT MODEL GENERATION METHOD, CIRCUIT VERIFICATION METHOD, AND CIRCUIT VERIFICATION DEVICE

机译:单元模型,单元模型生成方法,电路验证方法以及电路验证装置

摘要

PROBLEM TO BE SOLVED: To provide an element model, an element model generation method, a circuit verification method, and a circuit verification device which are capable of easily verifying limit characteristics of an element without using circuit verification means.;SOLUTION: An element model into which an element for use in simulation for verifying the operation of a circuit constituted of at least one element is modeled includes: a physical characteristic definition unit which defines physical characteristics peculiar to the element; an electric characteristic definition unit which defines electric characteristics being electric characteristics using the physical characteristics peculiar to the element and to be simulated; a limit characteristic definition unit which defines limit characteristics showing the limit of electric characteristics according with the physical characteristics peculiar to the element; and a limit characteristic verification unit which shows processing contents for verifying whether the electric characteristics according with the physical characteristics peculiar to the element violate the limit characteristics or not during the simulation.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种元件模型,元件模型生成方法,电路验证方法和电路验证装置,它们能够不使用电路验证装置而容易地验证元件的极限特性。用于在仿真中验证由至少一个元件构成的电路的工作的元件被建模为:物理特征定义单元,其定义该元件特有的物理特征;以及电特性定义单元,其使用元件特有的物理特性将电特性定义为电特性并进行仿真;极限特性定义单元,其根据元件特有的物理特性来定义表示电特性极限的极限特性;极限特性验证单元,其显示处理内容,以验证在模拟过程中具有与元素固有的物理特性相对应的电气特性是否违反极限特性。; COPYRIGHT:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013008077A

    专利类型

  • 公开/公告日2013-01-10

    原文格式PDF

  • 申请/专利权人 LAPIS SEMICONDUCTOR CO LTD;

    申请/专利号JP20110138463

  • 发明设计人 YOMOGIDA KOJI;

    申请日2011-06-22

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 16:57:51

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