Optical test of chiplet of the display device CROSS-REFERENCE TO RELATED APPLICATIONS DustinL. U.S. Patent Application No. 12 / 191,478 entitled No. is assigned to the assignee of the present invention is filed August 14, 2008 by Winters and other 'OLEDDeviceWithEmbeddedChipDriving' is referred to. The disclosure of this U.S. patent application is incorporated herein by reference.

摘要

The method comprising placing the method comprising providing a display substrate having a plurality of control electrodes in the display area, the tiplet multiple in response to the controller, providing the control electrode current, each chip cmdlet, a separate substrate Testing multiple light emitters are formed on the chiplet in one or emits light in response to a current having a pixel connecting one pad is electrically connected to the control electrode, at least, it is provided to the control electrode and it, and that through the current, and controls the chiplet so as to emit light in one or more of the test light emitter formed on the chiplet in A by detecting light test light emitter is emitted , and to identify the chiplet or interconnect tiplet defective, the method comprising replacing or repairing a tiplet or interconnect tiplet defective, the organic light emitting substrate of the display area that is connected to the control electrode Method of manufacturing a display comprising and forming a diode.