首页> 外国专利> Particle density measuring device and its method of measuring the particle mass concentration measuring device and the measurement method, as well as in the fluid in the fluid

Particle density measuring device and its method of measuring the particle mass concentration measuring device and the measurement method, as well as in the fluid in the fluid

机译:颗粒密度测量装置及其测量方法颗粒质量浓度测量装置及其测量方法以及在流体中的流体

摘要

PPROBLEM TO BE SOLVED: To provide an instrument and a method for measuring the density of particle in a fluid enabling measurements which are reduced in errors, even with respect to a fluid wherein a measuring target flows, and to provide an instrument and method for measuring the mass concentration of the particles in the fluid. PSOLUTION: The instrument 1 for measuring mass concentration of the particles in the fluid is equipped with a first light-scattering detector 10 for measuring the intensity of the scattered light of the particles in the fluid; a sizing device 20 for sizing the particles in the fluid passing through the first light-scattering detector 10; a second light-scattering detector 10' for measuring the intensity of the scattered light of the passing particles, after sizing in the fluid passing through the sizing device 20; a filter 40 for collecting the passing particles, after sizing in the fluid passing through the second light-scattering detector 10'; a suction device 50 for allowing the fluid serving as a measurement target, to flow through a route: first light-scattering detector 10sizing device 20second light-scattering detector 10'filter 40 from the outside of the instrument 1 for measuring the mass concentration of the particles; and a computation processing section 60 for performing calculation processings on the density of the particles in the fluid or control of the suction device 50. PCOPYRIGHT: (C)2011,JPO&INPIT
机译:<解决>要解决的问题:提供一种用于测量流体中的颗粒密度的仪器和方法,以使得即使对于其中测量目标流动的流体,也可以减小误差,并且提供一种仪器和方法。测量流体中颗粒质量浓度的方法。

解决方案:用于测量流体中的颗粒的质量浓度的仪器1配备有第一光散射检测器10,该第一光散射检测器10用于测量流体中的颗粒的散射光的强度。上浆装置20,用于对通过第一光散射检测器10的流体中的颗粒进行上浆。第二光散射检测器10',用于在对通过筛分装置20的流体进行筛分之后,测量通过的颗粒的散射光的强度;过滤器40,用于对通过第二光散射检测器10'的流体进行筛分后收集通过的颗粒。吸引装置50,其用于使作为测定对象的流体流经路径:第一光散射检测器10尺寸调整装置20第二光散射检测器10'从仪器1的外部过滤器40,用于测量被测物的质量浓度。粒子;

版权:(C)2011,日本特许经营&INPIT;计算处理部60,用于对流体中的颗粒密度进行计算处理或对抽吸装置50进行控制。

著录项

  • 公开/公告号JP5326120B2

    专利类型

  • 公开/公告日2013-10-30

    原文格式PDF

  • 申请/专利权人 柴田科学株式会社;

    申请/专利号JP20090248116

  • 发明设计人 柴田 眞利;小山 博巳;

    申请日2009-10-28

  • 分类号G01N15/02;

  • 国家 JP

  • 入库时间 2022-08-21 16:57:10

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号