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Originating in the alignment error

机译:源于对齐错误

摘要

PROBLEM TO BE SOLVED: To provide an aberration measurement and error correction method capable of correcting a measurement error generated due to an alignment error of a lens to be inspected in aberration measurement of a lens to be inspected on the basis of transmission wavefront measurement.;SOLUTION: The correspondence relationship between the amount of generation of an alignment error and the amount of generation of aberration is obtained by computer simulation, and the actual amount of generation of the alignment error is measured. On the basis of the obtained correspondence relationship and the actual amount of generation of the alignment error, the prediction amount of generation of aberration predicted to be generated due to the actual amount of generation is obtained, and the measurement error is corrected on the basis of the predicted amount of generation.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种像差测量和误差校正方法,该方法能够基于透射波前测量来校正由于在被检查透镜的像差测量中由于被检查透镜的对准误差而产生的测量误差。解决方案:通过计算机模拟获得对准误差的产生量和像差产生量之间的对应关系,并测量对准误差的实际产生量。基于所获得的对应关系和对准误差的实际产生量,获得由于实际产生量而被预测要产生的像差的产生预测量,并且基于测量误差校正测量误差。预计的发电量。;版权:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP5095539B2

    专利类型

  • 公开/公告日2012-12-12

    原文格式PDF

  • 申请/专利权人 富士フイルム株式会社;

    申请/专利号JP20080185484

  • 发明设计人 植木 伸明;

    申请日2008-07-17

  • 分类号G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-21 16:56:47

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