首页> 外国专利> Hole defect detection apparatus and hole defect detection method

Hole defect detection apparatus and hole defect detection method

机译:孔缺陷检测装置及孔缺陷检测方法

摘要

PROBLEM TO BE SOLVED: To provide a device and a method for detecting a hole defect detecting accurately existence of a hole defect and the position if a hole defect exists, by preventing surely excessive detection of hole defects of an inspection object by a light receiving part.;SOLUTION: In the hole defect detection device having a constitution for allowing the inspection object to enter between a light projection part 2 and the light receiving part 3 in a direct direction to an array direction of the light receiving part 3, and detecting successively by the light receiving part 2, light irradiated from the light projection part 2 and transmitted through a hole defect 1a of the inspection object, a plurality of shielding plates 5 for partitioning longitudinally a space by being erected toward a direction of the inspection object from the light projection part 2 and/or the light receiving part 3 are placed side by side in at least either space of a space between the light projection part 2 and the inspection object and a space 4 between the light receiving part 3 and the inspection object.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种用于通过可靠地防止光接收部过度地检测检查对象的孔缺陷来检测孔缺陷的装置和方法,以准确地检测孔缺陷的存在和是否存在孔缺陷。解决方案:在该孔缺陷检测装置中,其构造为允许检查对象沿着与光接收部3的排列方向直接的方向进入光投射部2和光接收部3之间,并依次进行检测。通过受光部2,从光投射部2射出并透过检查对象物的孔缺陷1a的光,通过从检查对象物向着检查对象物的方向立起而在纵向上隔开空间的多个遮蔽板5。光投射部分2和/或光接收部分3并排放置在光投射p之间的空间的至少任一空间中;第2条,检查对象以及受光部件3和检查对象之间的空间4。版权所有:(C)2010,JPO&INPIT

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号