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The strain resistant thin film and the production method and the strain resistant element and the strain detection device which use the strain resistant thin film

机译:耐应变薄膜以及使用该耐应变薄膜的制造方法,耐应变元件和应变检测装置

摘要

P To realize a higher GF and a lower TCR as to a strain-resistance thin film for use in various sensors and to reduction the variations in the TCRs of a plurality of elements in a bridge circuit. PSOLUTION: This strain-resistance element 10 is formed by laminating the strain-resistance thin film 4 consisting mainly of chromium and oxygen and electrodes 6, and a protective film 8 ON a substrate 2 of Si etc. having an oxide film ON the surface thereof. This strain-resistance thin film 4 is formed by providing chromium regions 12 and chromium oxide regions 14, and alternately arranging a plurality of chromium regions 12 and chromium oxide regions 14. PCOPYRIGHT: (C)2008 and JPO& INPIT
机译:

对于在各种传感器中使用的应变电阻薄膜,实现较高的GF和较低的TCR,并减小桥式电路中多个元件的TCR的变化。

解决方案:该应变电阻元件10是通过将主要由铬和氧组成的应变电阻薄膜4和电极6与保护膜8层压在具有氧化膜ON的Si等衬底2上而形成的其表面。通过设置铬区域12和氧化铬区域14,并交替地布置多个铬区域12和氧化铬区域14,来形成该应变电阻薄膜4。

COPYRIGHT:(C)2008和JPO&INPIT

著录项

  • 公开/公告号JP5309450B2

    专利类型

  • 公开/公告日2013-10-09

    原文格式PDF

  • 申请/专利权人 パナソニック株式会社;

    申请/专利号JP20070026722

  • 发明设计人 中村 友騎;

    申请日2007-02-06

  • 分类号H01C7/00;H01C7/18;H01C17/08;H01C17/12;

  • 国家 JP

  • 入库时间 2022-08-21 16:55:12

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