首页> 外国专利> Production manner of the negative resistance element, production manner of the single electronic tunnel component, production manner of the photosensor and the multiple nano dots which

Production manner of the negative resistance element, production manner of the single electronic tunnel component, production manner of the photosensor and the multiple nano dots which

机译:负电阻元件的制造方式,单个电子隧道部件的制造方式,光传感器和多个纳米点的制造方式,

摘要

PROBLEM TO BE SOLVED: To provide a negative resistance element and its manufacturing method which is manufactured by a simple process at a low cost with a high substrate selectivity, operable at a higher temperature than room temperature, and strong against the noise.;SOLUTION: A tunnel negative resistance element having a MOSFET structure is composed by forming a gate insulation film 12 on a substrate 11, forming thereon a multiple nanodot structure 13 composed of a plurality of nano-dots 13a which are made of an oxide semiconductor such as ZnO, etc. and mutually bonded through a double Schottky barrier 13b in one plane, and forming a source electrode 14 and a drain electrode 15 thereon. The nanodot 13a has a diameter of ≤60 nm or ≤20 nm. The tunnel negative resistance element is used for a single-electron transistor, a single-electron pump, a single-electron memory, etc.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种负电阻元件及其制造方法,该负电阻元件通过简单的工艺以低成本,高基板选择性,在高于室温的温度下可操作且抗噪声能力强的方法来制造。具有MOSFET结构的隧道负电阻元件是通过在衬底11上形成栅极绝缘膜12而构成的,在其上形成由多个纳米点13a组成的多个纳米点结构13,该多个纳米点由诸如ZnO的氧化物半导体制成,等,并在一个平面中通过双肖特基势垒13b相互键合,并在其上形成源电极14和漏电极15。纳米点13a的直径为≤60nm或≤20nm。隧道负电阻元件用于单电子晶体管,单电子泵浦,单电子存储器等;版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP5168824B2

    专利类型

  • 公开/公告日2013-03-27

    原文格式PDF

  • 申请/专利权人 ソニー株式会社;

    申请/专利号JP20060173394

  • 发明设计人 伊藤 大輔;

    申请日2006-06-23

  • 分类号H01L29/66;H01L29/786;H01L21/336;H01L29/06;

  • 国家 JP

  • 入库时间 2022-08-21 16:55:01

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