首页> 外国专利> Heat treatment apparatus, coating and developing treatment system, a heat treatment method, the coating and developing method and a heat treatment method or the coating and developing method recording medium storing a program for executing the

Heat treatment apparatus, coating and developing treatment system, a heat treatment method, the coating and developing method and a heat treatment method or the coating and developing method recording medium storing a program for executing the

机译:热处理装置,涂布显影处理系统,热处理方法,涂布显影方法以及热处理方法或涂布显影方法记录介质,其存储有用于执行所述程序的程序。

摘要

The disclosed heating device is to perform a heating process on an exposed substrate formed with a resist film before a developing process, the device including a heating part to perform a heating process on the exposed substrate, the heating part including a plurality of two-dimensionally arranged heating elements; a seating part provided at an upper side of the heating part, on which the substrate is disposed; and a control part to correct a setting temperature of the heating part based on temperature correction values, and to control the heating part based on the corrected setting temperature, during the heating process on one substrate by the heating part, wherein the temperature correction values being previously obtained from measured critical dimensions of the resist pattern in another substrate formed with the resist pattern through the heating process by the heating part and then the developing process.
机译:所公开的加热装置是在显影工序之前对形成有抗蚀剂膜的曝光基板进行加热处理的装置,该装置包括对曝光基板进行加热处理的加热部,该加热部包括二维的多个。布置加热元件;在加热部的上侧设置有底座部,在该底座部上配置有基板。控制部,其在加热部对一个基板进行加热处理时,基于温度校正值来校正加热部的设定温度,并基于校正后的设定温度来控制加热部,其中,温度校正值为通过在由加热部件进行的加热过程,然后是显影过程的,由形成有抗蚀剂图案的另一基板中的抗蚀剂图案的测量的临界尺寸,预先获得预定的尺寸。

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