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High quality silicon single crystal ingot production method, ingots produced from the device and the method and growth apparatus, wafer

机译:高质量硅单晶锭的生产方法,由该装置和方法生产的锭以及生长设备,晶片

摘要

PROBLEM TO BE SOLVED: To provide a method for growing a silicon single crystal ingot by a Czochralski method, by which a high quality silicon single crystal ingot can be produced with high productivity.;SOLUTION: The silicon single crystal ingot having a desired oxygen concentration and suppressed in defects is produced by independently controlling the temperature distribution and the oxygen concentration distribution of a silicon melt by applying an unbalanced magnetic field to the silicon melt so that the magnetic field intensity of an oxygen gushing region is different from that of a solid-liquid interface region.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种通过切克劳斯基方法生长单晶硅锭的方法,通过该方法可以高生产率地生产高质量的单晶硅锭;解决方案:具有所需氧浓度的单晶硅锭并通过对硅熔液施加不平衡磁场来独立控制硅熔液的温度分布和氧浓度分布,从而产生缺陷,从而使喷氧区域的磁场强度不同于固体熔体的磁场强度。液体界面区域。; COPYRIGHT:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP5150875B2

    专利类型

  • 公开/公告日2013-02-27

    原文格式PDF

  • 申请/专利权人 エルジー シルトロン インク;

    申请/专利号JP20060025029

  • 发明设计人 趙 鉉鼎;洪 寧皓;

    申请日2006-02-01

  • 分类号C30B29/06;C30B15/00;

  • 国家 JP

  • 入库时间 2022-08-21 16:54:18

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