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Glass substrate as well as the processing method of the glass substrate end surface and evaluation method of the glass substrate end surface

机译:玻璃基板以及玻璃基板端面的加工方法和玻璃基板端面的评价方法

摘要

Evaluation method of a glass substrate end face can be accurately assess the properties of the end surface of the glass substrate, and a method of processing the glass substrate end face based on this evaluation method, and based on the processing method, the present invention, the glass substrate end face providing a glass substrate can be a glass substrate which can reduce the adhesion of dust, preventing the drawbacks occurring burning, chipping, chipping of the chamfered surface on the basis of this processing method. In accordance with the present invention, binarized black and white image of the end face Z picked up by 14 laser microscope, and was identified as a black image specular white image, of the end face, to an area of ​​the black image a recess is present on the end face To evaluate the properties of the edge of the glass substrate based on the ratio of the area of ​​the white image. According to this evaluation method, in comparison with an evaluation method by roughness tester the existing system that depends on the size of the recess reliability of accuracy exists in the end face Z, more properties of the end face Z of the glass substrate G It can be evaluated accurately.
机译:本发明的玻璃基板端面的评价方法可以准确地评价玻璃基板端面的特性,基于该评价方法的玻璃基板端面的加工方法以及本发明,提供该玻璃基板的玻璃基板端面可以是这样的玻璃基板,该玻璃基板可以减少灰尘的附着,并且基于该处理方法防止倒角表面的烧伤,碎裂,碎裂的产生。根据本发明,通过14激光显微镜对端面Z进行二值化的黑白图像,并将其识别为端面的黑色图像镜面白色图像至黑色图像a的区域端面上存在凹槽可根据白色图像的面积比评估玻璃基板边缘的特性。根据该评价方法,与端面粗糙度检测器的评价方法相比,在端面Z上存在现有的取决于凹部的精度的精度的系统,玻璃基板G的端面Z具有更多的特性。被准确评估。

著录项

  • 公开/公告号JPWO2012005019A1

    专利类型

  • 公开/公告日2013-09-02

    原文格式PDF

  • 申请/专利权人 旭硝子株式会社;

    申请/专利号JP20120523774

  • 发明设计人 木村 友紀;鳥井 秀晴;宮本 幹大;

    申请日2011-02-21

  • 分类号G01N21/958;G09F9/00;C03C19/00;G02F1/1333;G01B11/30;G09F9/30;

  • 国家 JP

  • 入库时间 2022-08-21 16:54:15

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