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An improved programming algorithm to reduce faults with minimal additional time penalty

机译:一种改进的编程算法,以最小的附加时间损失来减少故障

摘要

Programming time of the non-volatile memory in a multi-pass programming process is shortened. In a first programming pass, while it is programmed by a sequence of program pulses, the cell of the low state is locked out of programming cells of the high state to identify the cell of the high state and slow cells with high speed and high that. While being temporarily locked out from programming, cells with high fast identified continues to the programmed state of the final object of these cells with high-low speed. Furthermore, the program pulse is stepped up sharply in order to program a cell of high state of slow. In a second programming pass, the cell of the high state of fast, is programmed with cells with other low until it reaches a state where they are all intended. Time savings can be attained as compared with the approach cells with high all be programmed in the first programming pass. [Selection] Figure Figure 1
机译:缩短了多遍编程过程中非易失性存储器的编程时间。在第一编程遍中,当通过一系列编程脉冲对其进行编程时,将低状态的单元锁定在高状态的编程单元之外,以识别高状态的单元以及具有高和高速度的慢单元。在暂时禁止编程的同时,具有高识别速度的单元将以高-低速度继续到这些单元的最终对象的编程状态。此外,为了对慢状态的高状态单元进行编程,编程脉冲急剧地升高。在第二遍编程中,将fast的高状态单元与其他low单元进行编程,直到达到所有预期状态为止。与在第一个编程通道中全部编程的高进场单元相比,可以节省时间。 [选择]图图1

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