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Spectrometer, spectroscopic measurement method, and spectral measurement program

机译:光谱仪,光谱测定方法及光谱测定程序

摘要

PPROBLEM TO BE SOLVED: To provide a spectral measuring instrument, a spectral measuring method, and a spectral measuring program which can be preferably used for the evaluation of a light-emitting material. PSOLUTION: The spectral measuring instrument 1A is equipped with the integrating sphere 20 arranged in a sample S and having an incident opening part 21 on which exciting light is thrown and an emitting opening part 22 for emitting the light to be measured from the sample S, a spectral analyzer 30 for spectrally diffracting the light to be measured to acquire a wavelength spectrum, and a data analyzer 50. The data analyzer 50 has a target region setting part for setting the first target region corresponding to the exciting light in the wavelength spectrum and the second target region corresponding to the emission from the sample S, a weight coefficient setting part for variably setting a weight coefficient with respect to at least one of the wavelength spectra in the first and second regions and a sample data analyzing part for analyzing the wavelength spectra using the first and second regions and the weight coefficient to acquire the data related to the sample S. PCOPYRIGHT: (C)2009,JPO&INPIT
机译:<解决的问题:提供一种光谱测量仪器,光谱测量方法和光谱测量程序,其可以优选地用于评估发光材料。

解决方案:光谱测量仪器1A配备有设置在样品S中的积分球20,积分球20具有入射开口部分21,在该入射开口部分21上投射有激发光,以及发射开口部分22,用于从该开口发射待测光。样品S,光谱分析器30和光谱数据分析器50,光谱分析器30用于对要测量的光进行光谱衍射以获取波长光谱,数据分析器50具有目标区域设置部分,该目标区域设置部分用于设置与目标光中的激发光相对应的第一目标区域。波长光谱和与样品S的发射相对应的第二目标区域,用于对第一区域和第二区域中的至少一个波长光谱可变地设置权重系数的权重系数设置部分和用于使用第一和第二区域以及权重系数分析波长光谱,以获取与样本S相关的数据。

COPYRIGHT:(C) 2009,日本特许厅

著录项

  • 公开/公告号JP5090837B2

    专利类型

  • 公开/公告日2012-12-05

    原文格式PDF

  • 申请/专利权人 浜松ホトニクス株式会社;

    申请/专利号JP20070242887

  • 发明设计人 鈴木 健吾;井口 和也;

    申请日2007-09-19

  • 分类号G01N21/64;G01N21/01;G01J3/46;

  • 国家 JP

  • 入库时间 2022-08-21 16:53:15

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