首页> 外国专利> DIAPHRAGM POSITION MEASURING METHOD, DIAPHRAGM POSITION MEASURING APPARATUS, DIAPHRAGM POSITIONING METHOD AND DIAPHRAGM POSITIONING APPARATUS

DIAPHRAGM POSITION MEASURING METHOD, DIAPHRAGM POSITION MEASURING APPARATUS, DIAPHRAGM POSITIONING METHOD AND DIAPHRAGM POSITIONING APPARATUS

机译:隔膜位置测量方法,隔膜位置测量设备,隔膜位置方法和隔膜位置测量设备

摘要

A diaphragm position measuring method and a diaphragm position measuring apparatus are disclosed, which are capable of measuring a deviation quantity between a center of an optical diaphragm and an optical axis with high accuracy. A diaphragm positioning method and a diaphragm positioning apparatus are further disclosed, which are capable of disposing the optical diaphragm in a lens unit with the high accuracy. A light condensing spot is formed by getting a collimated beam of light incident upon lenses of the lens units supported on a glass sheet, and a position of the light condensing spot, if detected by a microscope, can be used as a reference point for positioning the optical diaphragm. A central processing unit can obtain a deviation quantity between the position of the light condensing spot and a central position of the optical diaphragm, which is acquired by the microscope, and the lens unit can be effectively inspected by use of a result thereof. It is thereby feasible to detect the deviation quantity of the central position of the optical diaphragm with an error equal to or smaller than ±3 μm.
机译:公开了一种光阑位置测量方法和光阑位置测量设备,其能够高精度地测量光学光阑的中心与光轴之间的偏差量。还公开了一种光阑定位方法和光阑定位设备,其能够将光学光阑高精度地布置在透镜单元中。通过使入射在玻璃板上的透镜单元的透镜上的准直光束入射而形成聚光点,并且如果被显微镜检测到,则该聚光点的位置可以用作定位的参考点。光学膜片。中央处理单元可以获得在聚光点的位置和光学膜片的中心位置之间的由显微镜获取的偏差量,并且可以利用其结果有效地检查透镜单元。由此可行的是,以等于或小于±3μm的误差来检测光学膜片的中心位置的偏差量。

著录项

  • 公开/公告号US2013120762A1

    专利类型

  • 公开/公告日2013-05-16

    原文格式PDF

  • 申请/专利权人 KAZUHIRO WADA;

    申请/专利号US201113811536

  • 发明设计人 KAZUHIRO WADA;

    申请日2011-07-12

  • 分类号G01B11/14;

  • 国家 US

  • 入库时间 2022-08-21 16:51:43

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