METHOD AND APPARATUS FOR ACCELERATING DEVICE DEGRADATION AND DIAGNOSING THE PHYSICAL CHANGES OF THE DEVICE DURING THE DEGRADATION PROCESS

摘要

Embodiments of the present invention comprise methods and apparatus for testing devices. In some embodiments, a method for testing a device includes operating the device in a stress inducing mode using a first set of conditions for a first period of time; determining a first value for a plurality of device parameters after the first period of time; operating the device in the stress inducing mode using the first set of conditions for a second period of time; determining a second value for the plurality of device parameters after the second period of time; and determining if one or more components of the device has at least one of failed or physically changed by comparing the first and second values for the plurality of device parameters.