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Systematic benchmarking system and method for standardized data creation, analysis and comparison of semiconductor technology node characteristics
Systematic benchmarking system and method for standardized data creation, analysis and comparison of semiconductor technology node characteristics
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机译:用于半导体技术节点特性的标准化数据创建,分析和比较的系统基准系统和方法
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摘要
One aspect provides a method of designing an integrated circuit. In one embodiment, the method includes: (1) generating a functional design for the integrated circuit, (2) determining performance objectives for the integrated circuit, (3) determining an optimization target voltage for the integrated circuit, (4) determining whether the integrated circuit needs voltage scaling to achieve the performance objectives at the optimization target voltage and, if so, whether the integrated circuit is to employ static voltage scaling or adaptive voltage scaling, (5) using the optimization target voltage to synthesize a layout from the functional integrated circuit design that meets the performance objectives by employing standardized data created by designing at least one representative benchmark circuit, and (6) performing a timing signoff of the layout at the optimization target voltage.
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