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Enhanced diagnosis with limited failure cycles
Enhanced diagnosis with limited failure cycles
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机译:有限的故障周期,增强了诊断能力
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摘要
Chain or logic diagnosis resolution can be enhanced in the presence of limited failure cycles using embodiments of the various methods, systems, and apparatus described herein. For example, pattern sets can be ordered according to a diagnosis coverage figure, which can be used to measure chain or logic diagnosability of the pattern set. Per-pin based diagnosis techniques can also be used to analyze limited failure data.
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