首页> 外国专利> Method for adaptively correcting drift conditions in a force measuring device and force measuring device for carrying out the method.

Method for adaptively correcting drift conditions in a force measuring device and force measuring device for carrying out the method.

机译:在力测量装置中自适应地校正漂移条件的方法和用于执行该方法的力测量装置。

摘要

The method involves forming a measuring signal, and accessing drift parameters stored in a memory unit (15) by main-or host-processors. A time-dependent correction value is calculated, so that drift error of the signal is corrected. Automatically new optimized values for the parameters are determined within time intervals by the processors and a signal processing unit based on an optimization program, and are stored in the memory unit. An independent claim is also included for a force measuring device e.g. balance.
机译:该方法包括形成测量信号,并且由主处理器或主处理器访问存储在存储器单元(15)中的漂移参数。计算与时间有关的校正值,从而校正信号的漂移误差。处理器和信号处理单元根据优化程序在时间间隔内自动确定参数的新优化值,并将其存储在存储单元中。力测量装置例如,包括平衡。

著录项

  • 公开/公告号PL1736745T3

    专利类型

  • 公开/公告日2012-12-31

    原文格式PDF

  • 申请/专利权人 METTLER-TOLEDO GMBH;

    申请/专利号PL20050105422T

  • 发明设计人 TELLENBACH JEAN-MAURICE;REBER DANIEL;

    申请日2005-06-21

  • 分类号G01G3/14;G01G23/01;

  • 国家 PL

  • 入库时间 2022-08-21 16:40:26

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