TANDEM MASS SPECTROMETER AND TANDEM MASS SPECTROMETRY METHOD

摘要

the present invention relates to a tandem mass spectrometer.including an ionization source (1) capable of producing an ion mass analyzer, comprising an ion trap (2) arranged to receive ions from the ion source and methods ability to detect ions detected from the ion trap mass m as a function of the load z (m / z) of ion activation means which at least a portion of the ion fragmentss and trapped in the ion trap, and coupling means arranged between the ion trap and the means to activate the ions.according to the invention, the means to activate the ions are formed by a glow discharge lamp (4) suitable for generating a light beam directed to the ion trap (2).the beam of light is electromagnetic radiation in the wavelength range from the vacuum ultraviolet to the photon energy between e and e (41 in such a way as to pointsat least a part of ions trapped in the ion trap (2).