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OPTICAL SYSTEM FOR MEASUREMENTS, AND LUMINANCE COLORIMETER AND COLORIMETER USING SAME

机译:光学测量系统以及使用相同的亮度定色仪和定色仪

摘要

In a measuring probe 40, a measuring beam is diffused by a first diffusion plate 19, and when received by a plurality of light-receiving sensors 13B, 14B, 15B via a plurality of interference filters 13A, 14A, 15B, the measuring beam is made incident on the interference filters 13A, 14A, 15B via second diffusion plates 13C, 14C, 15C. Those interference filters 13A, 14A, 15B are formed such that transmittance characteristics corresponding to a measurement parameter are obtained correspondingly to intensity distribution conditions for an angle of incidence of light incident on the interference filters 13A, 14A, 15B. Therefore, the measuring probe 40 can reduce the effect of displacement of the transmission characteristic caused by the angle of incidence, while using the interference filters 13A, 14A, 15B.
机译:在测量探头40中,测量光束被第一扩散板19散射,并且当通过多个干涉滤光器13A,14A,15B被多个光接收传感器13B,14B,15B接收时,测量光束为经由第二扩散板13C,14C,15C入射到干涉滤光片13A,14A,15B上的电子。那些干涉滤光片13A,14A,15B形成为使得对应于入射到干涉滤光片13A,14A,15B上的光的入射角的强度分布条件获得与测量参数相对应的透射率特性。因此,在使用干涉滤光片13A,14A,15B的情况下,测量探针40可以减小由入射角引起的透射特性的位移的影响。

著录项

  • 公开/公告号KR20130004517A

    专利类型

  • 公开/公告日2013-01-10

    原文格式PDF

  • 申请/专利权人 KONICA MINOLTA OPTICS INC.;

    申请/专利号KR20127030595

  • 发明设计人 TSURUTANI KATSUTOSHI;

    申请日2011-03-15

  • 分类号G01J3/51;

  • 国家 KR

  • 入库时间 2022-08-21 16:27:55

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