首页> 外国专利> SLICE SELECTION DETECTION AND CORRECTION METHOD OF INCORRECT MAGNETIC RESONANCE IMAGE DATA IN SLICE MULTIPLEXING MEASUREMENT SEQUENCES, AND A MAGNETIC RESONANCE SYSTEM

SLICE SELECTION DETECTION AND CORRECTION METHOD OF INCORRECT MAGNETIC RESONANCE IMAGE DATA IN SLICE MULTIPLEXING MEASUREMENT SEQUENCES, AND A MAGNETIC RESONANCE SYSTEM

机译:片多路复用测量序列中不正确的磁共振图像数据的片选择检测和校正方法及磁共振系统

摘要

PURPOSE: Slice selection detection and correction method of incorrect magnetic resonance image data in slice multiplexing measurement sequences, and a magnetic resonance system are provided to reduce measurement time.;CONSTITUTION: A first acquisition sequence is performed from a first segment(51) of a first magnetization coherence curve(53). A second acquisition sequence is performed from a second segment(52) of a second magnetization coherence curve(54). MR data is obtained. A slice selection correction data detection step(40a,40b) is performed.;COPYRIGHT KIPO 2013
机译:目的:提供切片多路复用测量序列中不正确的磁共振图像数据的切片选择检测和校正方法,并提供一种磁共振系统以减少测量时间。;组成:从采集的第一段(51)开始执行第一采集序列第一磁化相干曲线(53)。从第二磁化相干曲线(54)的第二段(52)执行第二采集序列。获得了MR数据。进行切片选择校正数据检测步骤(40a,40b)。; COPYRIGHT KIPO 2013

著录项

  • 公开/公告号KR20130025345A

    专利类型

  • 公开/公告日2013-03-11

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号KR20120096211

  • 发明设计人 FEIWEIER THORSTEN;

    申请日2012-08-31

  • 分类号A61B5/055;

  • 国家 KR

  • 入库时间 2022-08-21 16:27:32

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