首页> 外国专利> METHOD OF FORMING A THROUGH-SILICON VIA BY USING LASER ABLATION, WHICH IS CAPABLE OF REPLACING A CONVENTIONAL DRY ETCHING PROCESS

METHOD OF FORMING A THROUGH-SILICON VIA BY USING LASER ABLATION, WHICH IS CAPABLE OF REPLACING A CONVENTIONAL DRY ETCHING PROCESS

机译:通过激光烧蚀形成通孔硅的方法,该方法可以代替常规的干法刻蚀工艺

摘要

PURPOSE: A method of forming a through-silicon via by using laser ablation is provided to form a long groove firstly and form a through-hole by using a grinding process secondly, thereby simplifying a process of forming the through-silicon via.;CONSTITUTION: A method of forming through-silicon vias by using laser ablation comprises the steps of: preparing a silicon wafer (210); laser drilling to form a plurality of grooves (220) by irradiating a laser beam (L) onto a first surface (211) of the silicon wafer; and grinding a second surface (212) of the silicon wafer to form a plurality of through-silicon vias by exposing the grooves on the second surface of the silicon wafer. The step of laser drilling comprises using an ultrashort pulse laser (230). In the step of grinding, an upper surface of the silicon wafer is ground.;COPYRIGHT KIPO 2013
机译:目的:提供一种通过激光烧蚀形成硅通孔的方法,该方法首先形成长槽,然后通过磨削工艺形成通孔,从而简化了形成硅通孔的过程。 :通过使用激光烧蚀形成硅通孔的方法包括以下步骤:准备硅晶片(210);通过将激光束(L)照射到硅晶片的第一表面(211)上来进行激光钻孔以形成多个凹槽(220);并通过暴露所述硅晶片的第二表面上的凹槽来研磨所述硅晶片的第二表面(212)以形成多个硅通孔。激光钻孔的步骤包括使用超短脉冲激光器(230)。在研磨步骤中,对硅晶片的上表面进行了研磨。; COPYRIGHT KIPO 2013

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