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TESTING DEVICE CAPABLE OF SHORTLY FORMING A WIRING LENGTH FROM A TESTING DEVICE TO A PROBE CIRCUIT BOARD
TESTING DEVICE CAPABLE OF SHORTLY FORMING A WIRING LENGTH FROM A TESTING DEVICE TO A PROBE CIRCUIT BOARD
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机译:能够快速形成从测试设备到探针电路板的接线长度的测试设备
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摘要
PURPOSE: A testing device is provided to reduce design costs of a probe circuit board by reducing noise between the wirings.;CONSTITUTION: A testing device comprises a probe card (2), a test head (17). The probe card includes a plurality of probes touching to a plurality of electrodes of each chip corresponding to a testing target chip of a semiconductor wafer. The test head applies a testing signal from the testing device to each probe by electrically connecting to each probe of the probe cards. The testing device constructs a plurality of array regions and a plurality of tester lands (37). The tester lands of the probe circuit board are individually connected to the plurality of the probes. The plurality of the array regions divides a plurality of electric contact units (29) according to a testing target chip.;COPYRIGHT KIPO 2013
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