首页> 外国专利> PROPERTY TEST METHOD OF A LIGHT EMITTING DIODE WHICH PERFORMS A TEST OF THE LIGHT EMITTING DIODE BY TRANSFERRING A LIGHT EMITTING DIODE WHICH IS PRODUCTION COMPLETED TO AN OPTICAL PROPERTY TEST PART OR AN ELECTRIC PROPERTY TEST PART BY NOT TAKING OUT THE PRODUCTION COMPLETED LIGHT EMITTING DIODE FROM A TRAY

PROPERTY TEST METHOD OF A LIGHT EMITTING DIODE WHICH PERFORMS A TEST OF THE LIGHT EMITTING DIODE BY TRANSFERRING A LIGHT EMITTING DIODE WHICH IS PRODUCTION COMPLETED TO AN OPTICAL PROPERTY TEST PART OR AN ELECTRIC PROPERTY TEST PART BY NOT TAKING OUT THE PRODUCTION COMPLETED LIGHT EMITTING DIODE FROM A TRAY

机译:通过将生产完成后的光发射二极管转移到光学性能测试部分或电气性能测试部分而不通过从生产完成的光发射出来的光电二极管的性能测试方法,对发光二极管进行性能测试一个托盘

摘要

PURPOSE: A property test method of a light emitting diode (LED) is provided to reduce a cycle time for a test and to test lots of LEDs in the same time by not purchasing multiple expensive devices.;CONSTITUTION: A tray having an LED which is production completed is successively loaded in a loading unit (S10). A transfer part separates one tray located on the uppermost portion or lowest portion and transfers it to an optical property test part in the state the tray having the LED under the test is loaded in the loading part. A lens radiates and an optical property test is executed in the state that an optical parabolic lens attached to the lower side of a test module is connected to the LED in the tray after the test module descends (S30). The test module ascends to a top dead point and the tray is transferred to an electrical characteristic test part by the transfer part and an electrical characteristic test is executed during a predetermined time (S40,S50).;COPYRIGHT KIPO 2013;[Reference numerals] (AA) Successively loading a tray having LED in a loading unit; (BB) Separating one tray from a loading part and transferring it to an optical property test part; (S30) Executing optical property tests of LED in the tray in order after the test module descends; (S30-1,S50-1) Preventing the deformation of the tray by mounting the tray in a tray deformation correcting member and clamping it with a clamper; (S40) Tray having LED for which the optical property tests are completed is transferred to an electrical characteristic test part by the transfer part; (S50) Electrical characteristic test part executes an electrical characteristic test for the electrical characteristic of the LED in the tray; (S60) Unloading the tray having the LED for which the electrical characteristic test is completed
机译:目的:提供一种发光二极管(LED)的性能测试方法,以减少测试的周期时间,并且通过不购买多个昂贵的设备来同时测试许多LED。组成:具有LED的托盘生产完成后,依次装载到装载单元中(S10)。转移部将位于最上部或最下部的一个托盘分离,并且在将具有被测LED的托盘装载到装载部的状态下,将其转移到光学特性检查部。在测试模块下降之后,将附着在测试模块下侧的光学抛物线透镜连接到托盘中的LED的状态下,透镜发光并执行光学性能测试(S30)。测试模块上升到上止点,并且托盘通过传送部件传送到电气特性测试部件,并在预定时间内执行电气特性测试(S40,S50)。; COPYRIGHT KIPO 2013; [参考数字] (AA)将具有LED的托盘依次装载到装载单元中; (BB)从装载部分分离一个托盘并将其转​​移到光学性能测试部分; (S30)在测试模块下降后,依次执行托盘中LED的光学性能测试; (S30-1,S50-1)通过将托盘安装在托盘变形校正构件中并用夹具夹紧来防止托盘变形。 (S40)将具有完成了光学特性测试的LED的托盘通过转印部转印到电特性测试部。 (S50)电特性测试部对托盘中的LED的电特性进行电特性测试。 (S60)卸载具有完成电气特性测试的LED的托盘

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