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SEMICONDUCTOR ELEMENT TESTING DEVICE CAPABLE OF SIMPLIFYING AN ASSEMBLY PROCESS AND CAPABLE OF REDUCING MANUFACTURING COSTS
SEMICONDUCTOR ELEMENT TESTING DEVICE CAPABLE OF SIMPLIFYING AN ASSEMBLY PROCESS AND CAPABLE OF REDUCING MANUFACTURING COSTS
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机译:能够简化装配过程并能够降低制造成本的半导体元件测试设备
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摘要
PURPOSE: A semiconductor element testing device is provided to reinforce connectivity between a device under test (DUT) board and the contact pint of a socket by combining the DUT board with the socket.;CONSTITUTION: A coupling unit (100) comprises a protrusion part (120) constructing a center line; a pair of side walls (130) forming both side walls; and a hook (110) formed at the side wall. A plate including the protrusion part is connected to a DUT board (30) with an elastic force. When the protrusion part compresses the DUT board, the DUT board compresses a part in which the contact pin of the socket is located. The DUT board is electrically connected to a base (20).;COPYRIGHT KIPO 2013;[Reference numerals] (AA) Strabismus view; (BB) Side view
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