首页> 外国专利> THE METHOD OF PREDICTING SILICON CONTENT AND THE METHOD OF PREDICTING SILICON OXIDE CONTENT USING THE SAME

THE METHOD OF PREDICTING SILICON CONTENT AND THE METHOD OF PREDICTING SILICON OXIDE CONTENT USING THE SAME

机译:预测硅含量的方法和使用相同方法预测氧化硅含量的方法

摘要

Disclosed are a method for predicting the content of silicon and a method for predicting the content of silicon oxide using the same to know the each content of the silicon and silicon oxide in a sample. The method for predicting the content of the silicon according to the present invention comprises: a step for measuring mass (A) after inserting the fixed amount of the sample into a crucible (a); a step for inserting the crucible containing the sample into an electric furnace, reacting the silicon and oxygen at 940-960 according to chemical formula 1 (Si + O_2 SiO_2(S)), taking the crucible containing the reacted sample out of the electric furnace, and then measuring mass (B)(b); and a step for calculating the content of the silicon by comparing the mass (A) with the mass (B). [Reference numerals] (AA) Start;(BB) End;(S110) Heating;(S120) Measuring mass before reaction;(S130) Measuring mass after reaction;(S140) Comparing mass
机译:公开了一种用于预测硅含量的方法和一种用于预测硅含量的方法,利用该方法来知道样品中硅和氧化硅的每种含量。根据本发明的预测硅含量的方法包括:在将固定量的样品插入坩埚(a)之后,测量质量(A)的步骤;将装有样品的坩埚插入电炉中的步骤,使硅和氧根据化学式1(Si + O_2 SiO_2(S))在940-960下反应,将装有反应后样品的坩埚从电炉中取出,然后测量质量(B)(b);通过比较质量(A)和质量(B)来计算硅含量的步骤。 [标号](AA)开始;(BB)结束;(S110)加热;(S120)反应前的质量;(S130)反应后的质量;(S140)比较质量

著录项

  • 公开/公告号KR20130120347A

    专利类型

  • 公开/公告日2013-11-04

    原文格式PDF

  • 申请/专利权人 HYUNDAI STEEL COMPANY;

    申请/专利号KR20120043525

  • 发明设计人 PARK TAE CHANG;HWANG SUNG MIN;

    申请日2012-04-25

  • 分类号G01N5/02;G01N33/38;G01N25;

  • 国家 KR

  • 入库时间 2022-08-21 16:25:59

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