首页> 外国专利> ENHANCED RESURF HVPMOS DEVICE WITH STACKED HETERO-DOPING RIM AND GRADUAL DRIFT REGION

ENHANCED RESURF HVPMOS DEVICE WITH STACKED HETERO-DOPING RIM AND GRADUAL DRIFT REGION

机译:具有堆叠的异质掺杂RIM和渐变区域的增强型恢复HVPMOS器件

摘要

The first polar form of the HV-well formed in the second polarity type epitaxial layer (22) (26 ) on the HV PMOS (12) is formed on the substrate board 20 having, and at least some of HV wells over a pair of field oxide region (32, 34) comprises a. Insulated gate (40, 42) are formed on the substrate between the field oxide region. Stacked hetero-doped rims in the (50, 52, 60, 62) is HV-well, and its external edge of the gate-is formed by alignment. Between the buffer area of the first polarity type 66 HV well, and the interior edge of the gate itself - is formed of a sort. Drift region (68) of the second polarity type is between the buffer area, and its internal edge of the gate-forming in alignment. Drift region comprises a region having a gradual dopant concentration change (104), and a drain region 110 of the second polarity type.
机译:形成在HV PMOS(12)上的第二极性类型外延层(22)(26)中的HV阱的第一极性形式形成在具有一对至少一个HV阱的衬底板20上场氧化物区域(32、34)包括a。在场氧化物区域之间的衬底上形成绝缘栅(40、42)。 (50、52、60、62)中堆叠的异质掺杂边缘是HV阱,其栅极的外边缘是通过对齐形成的。在第一极性类型66 HV阱的缓冲区域和栅极本身的内部边缘之间形成一种。第二极性类型的漂移区(68)在缓冲区和其栅极形成的内部边缘之间对准。漂移区包括具有逐渐变化的掺杂剂浓度变化的区域(104)和第二极性类型的漏极区域110。

著录项

  • 公开/公告号KR101217988B1

    专利类型

  • 公开/公告日2013-01-02

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20077006006

  • 申请日2005-09-14

  • 分类号H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 16:25:57

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