REMOTE TEST FACILITY WITH WIRELESS INTERFACE TO LOCAL TEST FACILITIES

摘要

The central testing facility sends the test data wirelessly to a local testing facility. The local test facility testing the electronic device using the test data. The local test facility transmits the response data generated by the electronic device to the central test facility is the air. The central test facility will analyze the response data to determine whether or not the electronic device will pass the test. The central test facility may provide the testing results to other entities, such as electronic devices have been designed equipment design, production equipment or electronic devices that were prepared. Central test equipment to test the resource request is accepted from any of the local test facilities of the plurality of local test facilities, and schedule the test time corresponding to each of the test request, at the scheduled test time, the local test corresponding to the test data transmit wirelessly to the facility.