首页> 外国专利> The method of the dee voltage measurement using the turn separation of beam and the device for turn separation measurement

The method of the dee voltage measurement using the turn separation of beam and the device for turn separation measurement

机译:利用电子束的匝间分离进行迪电压测量的方法及匝间测量设备

摘要

PURPOSE: A method of measuring a dee voltage of a cyclotron and a probe for measuring the dee voltage are provided to easily and effectively measure the dee voltage. CONSTITUTION: A probe (40) measures a dee voltage of a cyclotron and includes a body (42) and a beam passing part (45). The body is a member in a plate rod shape and is arranged lengthways in the direction perpendicular to the acceleration direction of a spirally-accelerated beam. The beam passing part is formed on the body in a slot shape. The beam passing part sends a part of the beam accelerated in the cyclotron and scatters a part of the rest by colliding with the body.
机译:目的:提供一种测量回旋加速器的迪伊电压的方法和一种用于测量迪伊电压的探针,以容易且有效地测量迪伊电压。组成:探针(40)测量回旋加速器的Dee电压,并包括一个主体(42)和一个光束通过部件(45)。主体是板状的构件,并在与螺旋状加速光束的加速方向垂直的方向上沿长度方向配置。光束通过部以狭缝状形成在主体上。光束通过部分发送在回旋加速器中加速的一部分光束,并通过与人体碰撞而散射其余部分。

著录项

  • 公开/公告号KR101308944B1

    专利类型

  • 公开/公告日2013-09-24

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20120003090

  • 申请日2012-01-10

  • 分类号H05H13;G01R19/155;G01R1/067;

  • 国家 KR

  • 入库时间 2022-08-21 16:24:27

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