首页> 外国专利> APPARATUS FOR MODIFYING PHYSICAL PROPERTIES OF INORGANIC NANOMATERIAL USING FOCUSED ELECTRON-BEAM IRRADIATION, METHOD THEREFOR AND THE SAME INORGANIC NANOMATERIAL MODIFYED

APPARATUS FOR MODIFYING PHYSICAL PROPERTIES OF INORGANIC NANOMATERIAL USING FOCUSED ELECTRON-BEAM IRRADIATION, METHOD THEREFOR AND THE SAME INORGANIC NANOMATERIAL MODIFYED

机译:聚焦电子束辐照改性无机纳米材料物理性能的装置,方法和相同的无机纳米材料改性

摘要

According to an embodiment of the present invention, while using a focused electron beam by irradiating an electron beam to the specific portion of the nanostructure maintain the state of the inorganic nano-structure to quantitatively the optical properties of nano-scale in the specific portion, and modified qualitatively to which, by irradiating an electron beam to alternately focus nanostructures can be produced nano-barcode based on the light emission characteristics. In particular, for this, an embodiment of the present invention are inorganic nanostructures; Focus the electron beam irradiator to focus on maethi inorganic nanostructures to investigate the nanoscale electron beam; And inorganic nano nanoscale nanoscale focus the electron beam control unit for controlling the irradiation position of the electron beam in order to partially change in the optical properties of the structure; the apparatus comprises comprises a physical property change of the inorganic nano-structure using the electron beam focus. ;
机译:根据本发明的实施方式,在通过向纳米结构的特定部分照射电子束来使用聚焦电子束的同时,维持无机纳米结构的状态以定量地定量特定部分中的纳米尺度的光学特性,并进行定性的修饰,通过照射电子束以交替聚焦纳米结构,可以基于发光特性产生纳米条形码。特别地,为此,本发明的一个实施方案是无机纳米结构。聚焦电子束辐照器以聚焦在maethi无机纳米结构上以研究纳米级电子束;无机纳米纳米级纳米级聚焦电子束控制单元,以控制电子束的照射位置,以部分改变结构的光学性能;该设备包括利用电子束聚焦改变无机纳米结构的物理性质。 ;

著录项

  • 公开/公告号KR101310802B1

    专利类型

  • 公开/公告日2013-09-25

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20110037757

  • 申请日2011-04-22

  • 分类号B82B3/00;B01J19/12;

  • 国家 KR

  • 入库时间 2022-08-21 16:24:26

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号