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deflectometric arrangement for surface inspection
deflectometric arrangement for surface inspection
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机译:用于表面检查的偏转装置
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摘要
The invention relates to a deflectometric arrangement with a in a light - dark - pattern luminous planes pattern surface 1, the one plane surface 3 of a of a receptacle 5, which are held in the object is illuminated at an angle as well as a camera 2 for imaging a reflection image comprising a lens 2.1. The objective 2.1 and 2.2 are recognizing fingerprints no use are arranged such that the recognizing fingerprints no use 2.2 and thus the image plane be in a plane conjugate to the plane surface 3 is arranged, so that the object plane oe of the camera 2 on the surface 3 is.
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