首页> 外国专利> Method for inspecting transparent polymer substrate used in forming transparent area in banknote, involves determining polymer substrate to be defective if transmittance of UV light through region of polymer substrate exceeds preset value

Method for inspecting transparent polymer substrate used in forming transparent area in banknote, involves determining polymer substrate to be defective if transmittance of UV light through region of polymer substrate exceeds preset value

机译:用于在钞票的透明区域中形成的透明聚合物基板的检查方法,包括如果穿过聚合物基板的区域的紫外线的透射率超过预设值,则确定聚合物基板有缺陷。

摘要

The method involves irradiating the UV light from a light source (10) to a transparent polymer substrate (100). A sensor (20) is provided for receiving the light transmitted through the polymer substrate. The degree of transmittance of the UV light in the defined region of the polymer substrate is determined and the polymer substrate is determined to be defective if the transmittance of UV light through defined region of polymer substrate exceeds predetermined value. An independent claim is included for device for inspecting transparent polymer substrate.
机译:该方法包括将来自光源(10)的UV光辐射到透明聚合物基底(100)。提供传感器(20),用于接收透射通过聚合物基底的光。如果穿过聚合物基板的限定区域的UV光的透射率超过预定值,则确定在聚合物基板的限定区域中的UV光的透射度,并且确定聚合物基板有缺陷。包括用于检查透明聚合物基材的装置的独立权利要求。

著录项

  • 公开/公告号DE102011102858A1

    专利类型

  • 公开/公告日2012-12-06

    原文格式PDF

  • 申请/专利权人 GIESECKE & DEVRIENT GMBH;

    申请/专利号DE201110102858

  • 发明设计人 LOCHBIHLER HANS;

    申请日2011-05-30

  • 分类号G01N21/59;G01N21/31;

  • 国家 DE

  • 入库时间 2022-08-21 16:22:14

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