首页> 外国专利> Measuring probe for measuring thickness of thin layer in stationary device, has coil unit associated with outer face of housing, which is arranged facing spherical cap and is provided with disc-shaped support arranged with Archimedean coil

Measuring probe for measuring thickness of thin layer in stationary device, has coil unit associated with outer face of housing, which is arranged facing spherical cap and is provided with disc-shaped support arranged with Archimedean coil

机译:用于测量固定装置中的薄层厚度的测量探针,具有与壳体的外表面相关联的线圈单元,该线圈单元面对球形帽布置,并设有布置有阿基米德线圈的盘状支撑件

摘要

The measuring probe (11) has a housing (14) with a sensor element (17) which is provided along the longitudinal axis (16) and is movably received in the housing. A coil unit (44) is associated with the outer face of the housing, facing the spherical cap (21) arranged in the longitudinal axis. The coil unit associated with the spherical cap is provided with a disc-shaped or annular support (49) arranged with an Archimedean coil (51). Independent claims are included for the following: (1) sensor element; and (2) method for manufacturing sensor element.
机译:测量探针(11)具有带有传感器元件(17)的壳体(14),该传感器元件(17)沿着纵轴(16)设置并且可移动地容纳在壳体中。线圈单元(44)与壳体的外表面相关联,面对布置在纵向轴线上的球形盖(21)。与球形盖关联的线圈单元设置有布置有阿基米德线圈(51)的盘形或环形支撑件(49)。包括以下方面的独立权利要求:(1)传感器元件; (2)传感器元件的制造方法。

著录项

相似文献

  • 专利
  • 外文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号