A method for determining the transfer function of a signal processing system without known input signal

摘要

The present invention relates to a method for determining the transfer function of a signal vera beit ends system, which require no known input signal. The processes start from of two representations i₁(x) and i₂(x) of an object, which the system of differently scaled input signals originating from the object has generated, or of a representation i₁(x) of a first object and of a representation i₂(x) of a geometrically similar for this purpose, but differently scaled object. The representations are either be or is at the beginning of the process according to. According to the invention, they are transformed into a working chamber and in each case, cut-outs is selected, which is located on the same region of the object are. The quotient of the these two cutouts corresponding functions in the working chamber, from which the unknown input signal fall out, permits an unambiguous determination of the desired transfer function. For this determination, different methods are stated. The method can be in particular to improve the images of electron microscopes use, for which there is no suitable test structures for the determination of the transfer function.