DEVICE OF MEASURING OPTIMUM LOAD CHARACTERISTICS OF TRANSISTOR AND METHOD OF MEASURING OPTIMUM LOAD CHARACTERISTICS OF TRANSISTOR

摘要

PROBLEM TO BE SOLVED: To solve a problem such that when optimum load characteristics of a transistor are measured, conventional measuring equipment cannot perform direct measurement in an originally expected operating frequency band and computer simulation is also difficult.;SOLUTION: In the device and the method of measuring optimum load characteristics of a transistor, the characteristics of the transistor is divided into parasitic component characteristics that depends on the frequency of an input signal and optimum load characteristics against intrinsic part characteristics except the parasitic component characteristics and each characteristics are measured. Based on these measurement results, optimum load characteristics of the transistor are calculated.;COPYRIGHT: (C)2014,JPO&INPIT