首页> 外国专利> INTERFERENCE OBJECTIVE LENS OPTICAL SYSTEM AND OPTICAL INTERFERENCE MEASUREMENT DEVICE HAVING THE SAME INTERFERENCE OBJECTIVE LENS OPTICAL SYSTEM

INTERFERENCE OBJECTIVE LENS OPTICAL SYSTEM AND OPTICAL INTERFERENCE MEASUREMENT DEVICE HAVING THE SAME INTERFERENCE OBJECTIVE LENS OPTICAL SYSTEM

机译:具有相同的干涉目标透镜光学系统的干涉目标透镜光学系统和光学干涉测量装置

摘要

PROBLEM TO BE SOLVED: To achieve high accuracy of an optical interference measurement device by achieving a Mireau type interference object lens optical system for largely reducing flare light generated due to inner surface reflection in an objective lens, and improving the contrast of an interference optical image.;SOLUTION: In an interference objective lens optical system 15, an interference optical system 13 includes: a 1/4 wavelength plate 26 with a reference mirror 20 disposed in a direction orthogonal to the optical axis of an object lens 12 nearer at a measurement object W side than the top end of the objective lens; a half-mirror (film) 28 configured to branch the rays of light output from a light source 52 into a reference optical path via the reference mirror and a measurement optical path via the measurement object, and to multiplex reflected light from the reference mirror and reflected light from the measurement object, and to output it as interference light; a first polarizer 34 disposed between the objective lens and a light source; and a second polarizer 36 disposed in a crossed nicol state with respect to the first polarizer at the rear end side of the objective lens to which the interference light is emitted.;COPYRIGHT: (C)2014,JPO&INPIT
机译:要解决的问题:通过实现一种Mireau型干涉物镜光学系统来实现光学干涉测量装置的高精度,该系统可以大大减少由于物镜的内表面反射而产生的眩光,并改善干涉光学图像的对比度。解决方案:在干涉物镜光学系统15中,干涉光学系统13包括:一个1/4波长板26,在与物镜12的光轴正交的方向上放置一个参考镜20,该镜在测量时更接近物镜W侧比物镜顶端高;半反射镜(膜)28被配置为将从光源52输出的光线通过参考镜分支到参考光路,并通过测量对象而进入测量光路,并复用来自参考镜和反射镜的反射光。来自测量对象的反射光,并将其作为干涉光输出;在物镜和光源之间设置有第一偏振片34。第二偏振器36相对于第一偏振器以正交尼科耳状态设置在物镜的后端侧,并向其发射干涉光。;版权所有:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2014095642A

    专利类型

  • 公开/公告日2014-05-22

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20120247920

  • 发明设计人 MORIUCHI EISUKE;

    申请日2012-11-09

  • 分类号G01B9/02;G02B21/02;

  • 国家 JP

  • 入库时间 2022-08-21 16:19:13

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