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LOGIC VERIFICATION DEVICE, LOGIC VERIFICATION METHOD AND LOGIC VERIFICATION PROGRAM

机译:逻辑验证装置,逻辑验证方法和逻辑验证程序

摘要

PROBLEM TO BE SOLVED: To make logic verification more efficient and shorten a verification period by correcting a test pattern while continuing a verification simulation of a logic circuit.;SOLUTION: A logic verification device comprises: an event table 121 that defines an event occurrence condition consisting of at least one single condition; a condition occurrence table 120 that describes satisfaction method information for increasing occurrence frequency of the single condition; coverage information 110 that stores the number of event occurrences; and a pattern-generation-control change instruction unit 108 that extracts a single condition constituting the occurrence information for the event with a small number of occurrences from the event table 121, extracts the satisfaction method information for the extracted single condition from the occurrence table 120, generates control change instruction information for correcting a test pattern 103 and outputs the generated information to a pattern generation control unit 102.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:在继续进行逻辑电路的验证仿真的同时,通过校正测试图案使逻辑验证更有效并缩短验证周期。解决方案:逻辑验证装置包括:事件表121,其定义事件发生条件由至少一个单一条件组成;条件发生表120,描述用于增加单个条件的发生频率的满足方法信息;存储事件发生次数的覆盖信息110;模式生成控制变更指示部108从事件表121中提取构成事件少的事件的事件信息的单一条件,从事件表120中提取所提取的单一条件的满足方法信息,产生用于校正测试图案103的控制改变指令信息,并将产生的信息输出到图案产生控制单元102。COPYRIGHT:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2014182509A

    专利类型

  • 公开/公告日2014-09-29

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORP;

    申请/专利号JP20130055603

  • 发明设计人 TAKEO TETSUYA;NISHIKAWA KOJI;

    申请日2013-03-18

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 16:18:59

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