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EMISSIVITY MEASURING APPARATUS AND EMISSIVITY MEASURING METHOD

机译:发射率测量装置和发射率测量方法

摘要

PROBLEM TO BE SOLVED: To provide an emissivity measuring apparatus to be applicable to a sample which undergoes a change of phase at an emissivity measurement temperature.;SOLUTION: An emissivity measuring apparatus 1 has a heat-up unit 5 in a vacuum case connected to a vacuum pump 3. The heat-up unit 5 has a sample placement board 6, a sample heat-up heater 7, a temperature gradient detection member 8 and a temperature gradient adjusting heater 9 in this order from the top. A sample 4 placed on the sample placement board 6 is heated up to an emissivity measurement temperature by the sample heat-up heater 7. In this moment, the temperature gradient adjusting heater 9 is controlled to cause heat generated by the sample heat-up heater 7 to move to the sample 4 so that the temperature gradient in the vertical direction of the temperature gradient detection member 8 becomes zero. A density of energy emitted by the sample 4 is obtained by dividing an output of the sample heat-up heater 7 by an a surface area of the sample 4 in this state, and an emissivity is calculated on the basis of the energy density, an emissivity of the sample 4 and a relation expression between the surface temperature and the container temperature.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种发射率测量装置,该发射率测量装置适用于在发射率测量温度下发生相变的样品。解决方案:发射率测量装置1在与真空箱连接的真空箱中具有加热单元5。加热单元5从顶部开始依次具有样品放置板6,样品加热加热器7,温度梯度检测构件8和温度梯度调节加热器9。通过样品加热加热器7将放置在样品放置板6上的样品4加热至发射率测量温度。此时,温度梯度调节加热器9被控制以引起由样品加热加热器产生的热量。然后,如图7所示,使温度梯度检测部件8的上下方向的温度梯度为零,移动至试样4。通过将样品加热加热器7的输出除以该状态下的样品4的表面积来获得由样品4发出的能量的密度,并基于该能量密度来计算发射率。样品4的发射率和表面温度与容器温度之间的关系表达式。;版权所有:(C)2014,日本特许厅&INPIT

著录项

  • 公开/公告号JP2014153168A

    专利类型

  • 公开/公告日2014-08-25

    原文格式PDF

  • 申请/专利权人 IHI CORP;

    申请/专利号JP20130022584

  • 发明设计人 IWAKI YUKI;

    申请日2013-02-07

  • 分类号G01N25/18;G01J5/00;

  • 国家 JP

  • 入库时间 2022-08-21 16:18:55

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