首页> 外国专利> CRYSTAL GRAIN SIZE MEASURING DEVICE AND CRYSTAL GRAIN SIZE MEASURING METHOD THEREOF

CRYSTAL GRAIN SIZE MEASURING DEVICE AND CRYSTAL GRAIN SIZE MEASURING METHOD THEREOF

机译:晶体粒度测量装置及其晶体粒度测量方法

摘要

PROBLEM TO BE SOLVED: To provide a crystal grain size measuring device or a crystal grain size measuring method capable of measuring an original crystal grain size or crystal grain size distribution on the basis of a diameter of a crystal cross section on a solid cross section when detecting the cross section of a solid and measuring the grain size of a crystal of the solid.;SOLUTION: A crystal grain size measuring device comprises: detection means for detecting a shape of a cross section; first calculation means for calculating a reference value for an area ratio of a grain size; second calculation means for calculating grain size distribution included in the cross section on the basis of the detected shape of the cross section; and third calculation means for correcting the calculated grain size distribution. The first calculation means calculates the area ratio reference value of a crystal being present within the cross section from a diameter of a crystal cross section which appears on the cross section, as a reference value. The third calculation means uses the calculated reference value to calculate a correction value for an area ratio of a maximum grain size in the grain size distribution and uses the correction value for the maximum grain size to calculate a correction value for an area ratio of a grain size smaller than the maximum grain size.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种晶粒尺寸测量装置或晶粒尺寸测量方法,其能够基于固体截面上的晶体截面的直径来测量原始晶粒尺寸或晶粒尺寸分布。检测固体的横截面并测量固体晶体的晶粒尺寸。解决方案:晶粒尺寸测量装置包括:用于检测横截面形状的检测装置;以及用于检测横截面形状的检测装置。第一计算装置,用于计算晶粒尺寸的面积比的参考值;第二计算装置,用于基于所检测的横截面形状来计算横截面中包括的晶粒尺寸分布;第三计算装置,用于校正计算出的晶粒尺寸分布。第一计算装置根据出现在横截面中的晶体横截面的直径,计算横截面内存在的晶体的面积比参考值作为参考值。第三计算装置使用计算出的参考值来计算晶粒尺寸分布中最大晶粒尺寸的面积比的校正值,并且使用用于最大晶粒尺寸的校正值来计算晶粒的面积比的校正值。尺寸小于最大晶粒尺寸。;版权所有:(C)2014,日本特许经营&INPIT

著录项

  • 公开/公告号JP2014134468A

    专利类型

  • 公开/公告日2014-07-24

    原文格式PDF

  • 申请/专利权人 SHINKO ELECTRIC IND CO LTD;

    申请/专利号JP20130002971

  • 发明设计人 TAKEUCHI YUKIHARU;

    申请日2013-01-10

  • 分类号G01B21/10;G01N15/02;

  • 国家 JP

  • 入库时间 2022-08-21 16:18:40

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