X-RAY PLATE THICKNESS MEASUREMENT METHOD AND X-RAY PLATE THICKNESS MEASUREMENT INSTRUMENT

摘要

PROBLEM TO BE SOLVED: To provide an X-ray plate thickness measurement method and an X-ray plate thickness measurement instrument which measure plate thickness by using a laminography method to generate image data for allowing fast and accurate measurement of respective thicknesses of overlapping plate members in an X-ray irradiation direction, in order to cope with issues of plate thickness inspection of a large-sized structure.;SOLUTION: The X-ray plate thickness measurement method has a function of alternately arranging a photographing position in a backward translation path and a photographing position in a forward translation path when photographing X-ray transmission data in the forward translation path and the backward translation path for scanning, whereby plate thickness can be measured by using a laminography method to generate image data for allowing fast and accurate measurement of respective thicknesses of overlapping plate members in an X-ray irradiation direction, in order to cope with issues of plate thickness inspection of a large-sized structure.;COPYRIGHT: (C)2014,JPO&INPIT