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The marking device and manner of the identification code, the identification code in the manner which

机译:标识装置和标识码的方式,标识码的方式

摘要

PROBLEM TO BE SOLVED: To solve such a problem that there is a higher possibility of causing a dead pixel, a dropout, and a fall to a part of identification codes when a force is applied from the outside as a ratio (so-called aspect ratio) of a height to a bottom area of a dot when overgrazing the dot in order to improve visibility in the identification code that is marked on the semiconductor device.;SOLUTION: In a device and a method of marking an identification code on a semiconductor device, a groove filling material is applied over the identification code or the identification codes are laminated and formed in such a manner as to reduce height differences at the recessed/projected portion of the identification code. Furthermore, the semiconductor device is marked with the identification code.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:解决这样的问题:当从外部施加一定比例的力时,更有可能导致像素变坏,掉落和掉落到一部分识别代码中(所谓的方面为了提高在半导体器件上标记的识别码的可见性而在过度擦拭点时其高度与点的底部面积之比);解决方案:一种在半导体上标记识别码的装置和方法在该装置中,将凹槽填充材料施加到识别码上,或者以减小识别码的凹进/突出部分的高度差的方式层叠和形成识别码。此外,该半导体器件还标有识别码。版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP5497418B2

    专利类型

  • 公开/公告日2014-05-21

    原文格式PDF

  • 申请/专利权人 東レエンジニアリング株式会社;

    申请/专利号JP20090284904

  • 发明设计人 井中 千草;

    申请日2009-12-16

  • 分类号H01L21/66;H01L21/02;

  • 国家 JP

  • 入库时间 2022-08-21 16:14:47

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