Standard pattern learning device, labeling standards calculating device, standard pattern learning method and program

摘要

PPROBLEM TO BE SOLVED: To improve the performance of an identification model in integrated learning of the identification model and a generation model through the use of labelled learning data and unlabelled learning data. PSOLUTION: A standard pattern learning device includes: an identification generation model integrated learning means 500 for integrally learning the identification model and the generation model under a restriction including a penalty item with respect to discrepancy between the parameters of the two models through the use of the labelled learning data and the unlabelled learning data; and a labeling criterion calculating means 501 for performing class identification processing by each of the identification model and the generation model learned by the identification generation model integrated learning means 500 with respect to each kind of unlabelled learning data to be given to the identification generation model integrated learning means 500, and calculating a labeling criterion indicating the necessity of adding an additional label, based on a difference in the result of identification between the identification model and the generation model. PCOPYRIGHT: (C)2011,JPO&INPIT