Being the method of searching the existence of analysis ones which are connected to the methodological null probe which at least searches

摘要

Topic This invention searches the existence of analysis ones which are joined to the probe, it regards new manner.Solutions The diffraction system the cyclic geometric pattern which (2) is formed (24), having with the field where it possesses probe A and the field where it does not possess probe A alternately, it is formed. In order the process where the above-mentioned diffraction system (2) contacts the media where content of analysis ones is doubted impression work process, namely the probe temporarily, exists and joins analysis ones to the probe, for there to be a diffraction Characteristic before, it is created. The above-mentioned manner at least process below: - Strength P of primary diffracted light of the diffraction field which was created by the diffraction system which possesses the probe of the not yet impression work is measured, - Probe A the impression work is done, - Strength P of primary diffracted light of the diffraction field which was created by the diffraction system is measured, - Strength P and P which were measured are compared,Thing is featured. Choice figure Figure 2b