Oscillator one quality survey instrument and oscillator one quality inspection method

摘要

P To provide oscillator stripe feature inspection apparatus and the oscillator stripe feature inspecting technique capable of conveying quartz crystal blank to an inspecting position with a high degree of accuracy to conduct inspection as the case. PSOLUTION: The oscillator stripe feature inspecting apparatus for inspecting electric feature of an oscillator stripe and such as quartz crystal blank and the like is an oscillator stripe feature inspecting apparatus which includes: a vacuum chuck absorbing to hold an oscillator stripe with negative-pressure; a first electrode deployed in integral situation or adjacent situation with the vacuum chuck; a first abutting face determining the position of the above vacuum chuck; a second electrode deployed so as to face against the vacuum chuck; a second abutting face determining the position at the side of the second electrode; a positioning mechanism abutting the first abutting face and the second abutting face to determine a relative distance of the first electrode and the second electrode. PCOPYRIGHT: (C)2010 and JPO& INPIT