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Adhesion to the culture aspect of the mannered null culture

机译:遵守习惯的无效文化的文化方面

摘要

PROBLEM TO BE SOLVED: To enable accurate measurement of a cellular thickness distribution, regardless of the changes in the refractive index of cells, accompanying the progress of cultivation.;SOLUTION: Two-dimensional distribution of phase information is obtained, in a state where a first culture solution L1 having a known first refractive index is stored so as to completely immerse cells S adhered onto a bottom face 1a of a culture vessel 1, by transmitting a light L of a predetermined wavelength through cells S and the first culture solution L1, and by photographing the transmitted light L. Next, two-dimensional distribution of phase information is obtained, in a state where a second culture solution L2 having a known second refractive index is stored to have a depth to completely immerse the cells S in the culture vessel 1, by transmitting the light L of the wavelength through cells S and the second culture solution L2, and by photographing the transmitted light L. Then, respective average values of the phase information are calculated. Next, the refractive index of the cell S is estimated, based on the ratio of the average value of the calculated phase information. Then, the thickness dimension is calculated by using the estimated refractive index.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:随着培养的进行,无论细胞的折射率如何变化,都能够准确测量细胞的厚度分布;解决方案:在以下条件下获得相位信息的二维分布存储具有已知的第一折射率的第一培养液L1,以使预定波长的光L透过细胞S和第一培养液L1,从而使附着在培养容器1的底面1a上的细胞S完全浸没,接下来,在存储具有已知第二折射率的第二培养液L2以具有将细胞S完全浸没在培养物中的深度的状态下,获得相位信息的二维分布。通过使波长为波长的光L透过细胞S和第二培养液L2,并拍摄所透射的光L,来对容器1进行摄像。计算相位信息的平均值。接下来,基于所计算的相位信息的平均值的比率来估计单元S的折射率。然后,通过使用估计的折射率来计算厚度尺寸。; COPYRIGHT:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP5424608B2

    专利类型

  • 公开/公告日2014-02-26

    原文格式PDF

  • 申请/专利权人 オリンパス株式会社;

    申请/专利号JP20080260574

  • 发明设计人 坂本 宜瑞;小林 雅之;福田 宏;

    申请日2008-10-07

  • 分类号C12Q1/06;G01N21/41;G01B11/06;

  • 国家 JP

  • 入库时间 2022-08-21 16:12:15

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