Being the test entry generation device which the independent abnormal type scenario which selects the test entry for the scenario

摘要

PROBLEM TO BE SOLVED: To detect an error occurring when executing multiple of times of a specific abnormal scenario only.;SOLUTION: In the present invention, a use case description is acquired from an inputted design model, a loop-less route is extracted from the use case description and added to a set of test routes, a loop-containing route is extracted from the use case description, and a new test route is created by linking the loop-less route and the loop-containing route of the set of test routes and added to a set of new additional test routes. Test routes containing only specific abnormal scenarios are extracted as target abnormal test routes from the set of new additional test routes and added to a set of abnormal test routes, loop points in each of the abnormal test routes in the set of abnormal test routes are duplicated, and test items for the test route are generated.;COPYRIGHT: (C)2013,JPO&INPIT