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IRRADIANCE MEASURING INSTRUMENT FOR MICROSCOPE, AND MICROSCOPE HAVING THE IRRADIANCE MEASURING INSTRUMENT

机译:显微镜的辐照度测量仪器,以及具有辐照度测量仪器的显微镜

摘要

An irradiance measuring instrument for a microscope is intended to measure irradiance of light emitted from an objective of the microscope. The irradiance measuring instrument for a microscope includes, in an order where the light emitted from the objective proceeds, an optical system including a single lens that has a nearly flat surface oriented toward the side of the objective and also has positive power, and a photodetector configured to detect the light in order to measure the irradiance of the light on the nearly flat surface.
机译:用于显微镜的辐照度测量仪器旨在测量从显微镜物镜发出的光的辐照度。用于显微镜的辐照度测量仪器包括从物镜发出的光前进的顺序,包括单个透镜的光学系统,该透镜具有朝着物镜侧面定向的几乎平坦的表面并且还具有正光焦度,以及光电探测器。配置为检测光以测量光在几乎平坦的表面上的辐照度。

著录项

  • 公开/公告号US2014291492A1

    专利类型

  • 公开/公告日2014-10-02

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORPORATION;

    申请/专利号US201414189446

  • 发明设计人 KENICHI KUSAKA;

    申请日2014-02-25

  • 分类号G01J1/42;G01N21/64;

  • 国家 US

  • 入库时间 2022-08-21 16:08:19

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